Sponsored by The Institute for Analytical Philately, Inc. (IAP)
The Smithsonian National Postal Museum (NPM)

CALL FOR PAPERS
The format of the Symposium will allow for about ten technical papers. Each paper must address the manner in which forensic analysis has been applied to solving a philatelic problem. Both studies of stamp characteristics (color, ink chemistry, paper, gum, etc.) and postal history items are welcome. Papers addressing methodology are preferred rather than a simple study or expertization of material that does not advance the state of the art in methods with broad applicability.

Abstracts for 500 words or less must be submitted by 1 April 2012 electronically to Symposium@AnalyticalPhilately.org

Proceedings will be published in a bound volume by the Smithsonian Institution Scholarly Press.

HIGHLIGHTS OF THE SYMPOSIUM
In addition to two days of technical presentations, there will be a half-day workshop, including hands-on experience with the NPM forensic equipment which includes a Foster & Freeman VSC 6000, a Bruker Tracer III-SD X-ray Fluorescence spectrometer, and a Bruker FT-IR (Fourier Transform Infrared) spectrometer. It is also hoped that the development of the new Gross Gallery at the NPM will be such that a special tour may be arranged for participants. Naturally, for those bringing a significant other, or coming in for the weekend, there are myriad opportunities to spend time visiting Smithsonian museums, the National Art Gallery, and the other museums and important US landmarks available in Washington.

KEYNOTE ADDRESS: David Beech, Head of the Philatelic Collections, The British Library, London
FEATURED SPEAKER: Dr. Bruce Kaiser, Chief Scientist, Bruker Elemental, UT

CALL FOR PARTICIPANTS
The venue will support a limited attendance. To insure a seat, advanced registration will be imperative. There is a registration fee of $95 (US) to cover the costs of breakfast refreshments and lunches at the venue. This may be paid through the IAP web site: www.AnalyticalPhilately.org, and selecting the "Symposium" item on the left side of the screen.

SHORT FORM
The First International Symposium on Analytical Methods in Philately will be held 12-14 November 2012 at the Smithsonian National Postal Museum in Washington, DC. This important technical meeting is sponsored by the Institute for Analytical Philately, Inc. and the Smithsonian National Postal Museum. To submit an abstract, register to participate or for more details, visit the IAP web site: www.AnalyticalPhilately.org